Ключевые слова: LTS, Nb3Sn, bulk, vortex dynamics, pinning, measurement technique, microwave devices, surface impedance, flux flow resistance, upper critical fields, flux creep
Flukiger R., Silva E., Spina T., Loria R., Anzellini S., Meneghini C., Irifune T., Schiesaro I., Torchio R.
Ключевые слова: LTS, Nb3Sn, high pressure processing, X-ray irradiation, microstructure, measurement technique
Ключевые слова: measurement technique, microwave devices, surface impedance
Galluzzi V., Mancini A., Puig T., Celentano G., Palau A., Obradors X., Bartolome E., Augieri A., Pompeo N., Silva E., Torokhtii K., Alimenti A.
Ключевые слова: HTS, YBCO, films epitaxial, PLD process, chemical solution deposition, substrate LaAlO3, nanoscaled effects, anisotropy, impedance, angular dependence, magnetic field dependence, measurement technique, defects, nanorods, twin boundaries, nanoparticles, pinning mechanism, flux flow resistance, comparison
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, doping effect, nanoscaled effects, defects, surface impedance, vortex dynamics, pinning, defects columnar, experimental results
Puig T., Palau A., Obradors X., Civale L., Maiorov B., Bartolome E., Pompeo N., Silva E., Rouco V., Valles F., Balakirev F.F.
Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Tendeloo G.V., Pompeo N., Silva E., Torokhtii K., Meledin A., Frolova A., Armenio1 A.A., Mancini1 A., Pinto1 V., Feighan J., Celentano1 G., Rizzo1 F., Augieri1 A.
Ключевые слова: presentation, HTS, YBCO, films, films epitaxial, doping effect, nanoscaled effects, PLD process, pinning centers artificial, pinning force, density, magnetic field dependence, critical caracteristics, Jc/B curves, microstructure, defects columnar, critical current density, angular dependence, resistive transition, X-ray diffraction, temperature dependence, growth rate, experimental results
Neves M.A., Silva E.P., Lopes A.J., Branco L.M., Berredo A.C., Nascimento C.A., Nascimento C.A., Mendonca G., Barony M.A., Pereira M.T., Guimaraes M.F., Teixeira P., Hojo T., Alves W.M., Pereyra L.A., Leo A.C., Neto D.P., Carvalho E.L.
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Torokhtii K., Frolova A.
Ключевые слова: HTS, YBCO, thin films, PLD process, substrate SrTiO3, fabrication, nanodoping, critical caracteristics, pinning, measurement technique, critical current density, microwave devices, Jc/B curves, pinning force, angular dependence, surface impedance, magnetic field dependence, nitrogen liquid , experimental results
Petrisor T., Ciontea L., Celentano G., Pompeo N., Silva E., Armenio A.A., Sotgiu G., Torokhtii K., Mos R.B., Nasui M., Pinto V., Piperno L., Frolova A.
Neves M.A., Rosario M.A., Reis T., Silva E.P., Lopes A.J., Branco L.M., Matias F., Brito A.S., Maia F.C., Queiroz A.R., Antunes J.C., Torres A.M., Costa L., Moldenhauer V., Berredo A.C., Nascimento C.A., Nascimento C.A., Junior E.L., Mendonca G., Barony M.A., Pereira M.T., Guimaraes M.F., Teixeira P., Hojo T., Alves W.M.
Ключевые слова: power equipment, cables three-in-one, HTS, YBCO, design, plans, coated conductors, nitrogen liquid , modeling computational
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Silva E., Armenio A.A., Sotgiu G., Pinto V., Piperno L., Frolova A., Lamanna R.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Pompeo N., Silva E., Armenio A.A., Sotgiu G., Torokhtii K., Pinto V., Frolova A.
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